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Full metadata record
DC Field | Value | Language |
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dc.contributor.author | Kondrat, O.B. | - |
dc.contributor.author | Holomb, R.M. | - |
dc.contributor.author | Kondrat, O.O. | - |
dc.contributor.author | Csik, A. | - |
dc.contributor.author | Veres, M. | - |
dc.contributor.author | Mitsa, V.M. | - |
dc.contributor.author | Міца, Володимир Михайлович | uk |
dc.date.accessioned | 2017-09-27T20:39:58Z | - |
dc.date.available | 2017-09-27T20:39:58Z | - |
dc.date.issued | 2017 | - |
dc.identifier.citation | Kondrat O.B., Holomb R.M., Kondrat O.O., Csik A., Veres M., Mitsa V.M. Surface XPS and UPS investigation of in situ prepared AsxSe100-x nanolayers and their modification under external influence // International research and practice conference «Nanotechnology and nanomaterials», 23-26 August 2017, Chernivtsi, Ukraine, p. 416. | uk |
dc.identifier.uri | https://dspace.uzhnu.edu.ua/jspui/handle/lib/15404 | - |
dc.description.abstract | Surface XPS and UPS investigation of in situ prepared AsxSe100-x nanolayers and their modification under external influence | uk |
dc.language.iso | en | uk |
dc.subject | AsxSe100-x | uk |
dc.title | Surface XPS and UPS investigation of in situ prepared AsxSe100-x nanolayers and their modification under external influence | uk |
dc.type | Text | uk |
dc.pubType | Тези до статті | uk |
Appears in Collections: | Наукові публікації кафедри інформаційних управляючих систем та технологій |
Files in This Item:
File | Description | Size | Format | |
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NANO-2017_416.pdf | 6.15 MB | Adobe PDF | View/Open |
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