Please use this identifier to cite or link to this item: https://dspace.uzhnu.edu.ua/jspui/handle/lib/13699
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dc.contributor.authorKondrat, O.B.-
dc.contributor.authorHolomb, R.M.-
dc.contributor.authorTsud, N.-
dc.contributor.authorMitsa, V.M.-
dc.contributor.authorМіца, Володимир Михайловичuk
dc.date.accessioned2017-06-01T19:51:25Z-
dc.date.available2017-06-01T19:51:25Z-
dc.date.issued2017-
dc.identifier.citationO. Kondrat, R. Holomb, N. Tsud, V. Mitsa. Complex spectroscopical study of top surface nanolayers of the AsxSe100-x thin films for their application in all optical signal processing // Materials of XVI International conference “Physics and technology of thin films and nanosystems”. – Iv.-Frankivsk, Ukraine, May 15-20, 2017. – pp. 286.uk
dc.identifier.urihttps://dspace.uzhnu.edu.ua/jspui/handle/lib/13699-
dc.description.abstractComplex spectroscopical study of top surface nanolayers of the AsxSe100-x thin films for their application in all optical signal processinguk
dc.language.isoenuk
dc.subjectsurface nanolayers of the AsxSe100-x thin filmsuk
dc.titleComplex spectroscopical study of top surface nanolayers of the AsxSe100-x thin films for their application in all optical signal processinguk
dc.typeTextuk
dc.pubTypeТези до статтіuk
Appears in Collections:Наукові публікації кафедри інформаційних управляючих систем та технологій

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