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dc.contributor.authorKondrat, O.-
dc.contributor.authorHolomb, R.M.-
dc.contributor.authorPopovych, N.-
dc.contributor.authorTsud, N.-
dc.contributor.authorMitsa, V.M.-
dc.contributor.authorМіца, Володимир Михайловичuk
dc.date.accessioned2015-12-09T23:06:29Z-
dc.date.available2015-12-09T23:06:29Z-
dc.date.issued2015-
dc.identifier.citationO. Kondrat, R. Holomb, N. Popovich, N. Tsud, V. Mitsa. Compositional investigations of the As-Se nanolayers using X-ray photoelectron spectroscopy // Materials of XV International conference “Physics and technology of thin films and nanosystems”. – Iv.-Frankivsk, Ukraine, May 11-16, 2015. – p. 175.uk
dc.identifier.urihttps://dspace.uzhnu.edu.ua/jspui/handle/lib/5142-
dc.description.abstractCompositional investigations of the As-Se nanolayers using X-ray photoelectron spectroscopyuk
dc.language.isoenuk
dc.subjectAs-Seuk
dc.subjectX-ray photoelectron spectroscopyuk
dc.titleCompositional investigations of the As-Se nanolayers using X-ray photoelectron spectroscopyuk
dc.typeTextuk
dc.pubTypeТези до статтіuk
Appears in Collections:Наукові публікації кафедри інформатики та фізико-математичних дисциплін
Наукові публікації кафедри інформаційних управляючих систем та технологій

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