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Название: | 2D semiconductor SnP2S6 as a new dielectric material for 2D electronics |
Авторы: | Hu, Jiayi Zheng, Anqi Pan, Er Chen, Jiangang Bian, Renji Li, Jinyao Liu, Qing Cao, Guiming Meng, Peng Jian, Xian Molnar, Alexander Vysochanskii, Yulian Liu, Fucai |
Ключевые слова: | semiconductor, dielectric, 2D electronics, SnP2S6 |
Дата публикации: | июл-2022 |
Издательство: | Journal of Materials Chemistry C |
Библиографическое описание: | 2D semiconductor SnP2S6 as a new dielectric material for 2D electronics / Jiayi Hu, Anqi Zheng, Er Pan, Jiangang Chen, Renji Bian, Jinyao Li, Qing Liu, Guiming Cao, Peng Meng, Xian Jian, Alexander Molnar, Yulian Vysochanskii Fucai Liu // Journal of Materials Chemistry C. - 2022. - pp.2050-7526. - https://doi.org/10.1039/D2TC01340A |
Краткий осмотр (реферат): | Due to the intriguing optical and electronic properties, 2D materials are promising for next generation optoelectrinc and electric device applications. Discovering new 2D materials with novel physical properties are rewarding for this area. In this work, we systematically investigated the optoelectronic properties of 2D metal thiophosphate SnP2S6 with unique nanoporous structure. The intermediate bandgap makes SnP2S6 a good candidate as bothe the channel and gate dielectric materials in the transistor device. SnP2S6 showed good photoresponse properties. In addition, the MoS2 transistor with SnP2S6 as dielectric layer shows a high dielectric constant( ≈23), low subthreshold slope down to 69.4 mV/dec, and it presented a 0.1 pA scale leakage current, a threshold voltage as low as 1.1 V, a ON/OFF ratio reaching 107 and negligible hysteresis with high stability and reproducibility. This work would open up new avenues for the discovery of new metal thiophosphate systems for future device applications. |
Описание: | Due to the intriguing optical and electronic properties, 2D materials are promising for next generation optoelectrinc and electric device applications. Discovering new 2D materials with novel physical properties are rewarding for this area. In this work, we systematically investigated the optoelectronic properties of 2D metal thiophosphate SnP2S6 with unique nanoporous structure. The intermediate bandgap makes SnP2S6 a good candidate as bothe the channel and gate dielectric materials in the transistor device. SnP2S6 showed good photoresponse properties. In addition, the MoS2 transistor with SnP2S6 as dielectric layer shows a high dielectric constant( ≈23), low subthreshold slope down to 69.4 mV/dec, and it presented a 0.1 pA scale leakage current, a threshold voltage as low as 1.1 V, a ON/OFF ratio reaching 107 and negligible hysteresis with high stability and reproducibility. This work would open up new avenues for the discovery of new metal thiophosphate systems for future device applications. |
Тип: | Text |
Тип публикации: | Стаття |
URI (Унифицированный идентификатор ресурса): | https://dspace.uzhnu.edu.ua/jspui/handle/lib/60113 |
Располагается в коллекциях: | Наукові публікації кафедри фізики напівпровідників |
Файлы этого ресурса:
Файл | Описание | Размер | Формат | |
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2022_J.Mat.Chem.C.pdf | article | 1.66 MB | Adobe PDF | Просмотреть/Открыть |
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