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DC Field | Value | Language |
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dc.contributor.author | Shylenko, O. | - |
dc.contributor.author | Bilanych, V. | - |
dc.contributor.author | Feher, A. | - |
dc.contributor.author | Rizak, V. | - |
dc.contributor.author | Komanicky, V. | - |
dc.date.accessioned | 2018-01-10T13:46:03Z | - |
dc.date.available | 2018-01-10T13:46:03Z | - |
dc.date.issued | 2017 | - |
dc.identifier.citation | Shylenko O., Bilanych V., Feher A., Rizak V., Komanicky V. Comparison of sensitivity of Ge9As9Se82 and Ge16As24Se60 thin films to irradiation with electron beam //8th International Conference on Amorphous and Nanostructured Chalcogenides. Abstract Book/ Sinaia, Romania, July 2-5, 2017, p.37-38. | uk |
dc.identifier.uri | https://dspace.uzhnu.edu.ua/jspui/handle/lib/13 | - |
dc.language.iso | en | uk |
dc.relation.ispartofseries | 8th International Conference on Amorphous and Nanostructured Chalcogenides. Abstract Book; | - |
dc.title | Comparison of sensitivity of Ge(9)As(9)Se(82) and Ge(16)As(24)Se(60) thin films to irradiation with electron beam | uk |
dc.type | Text | uk |
dc.pubType | Тези до статті | uk |
Appears in Collections: | Наукові публікації кафедри прикладної фізики |
Files in This Item:
File | Description | Size | Format | |
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2017_Romania_Sinaia_Abstract_Book_P_37-38.pdf | 2.37 MB | Adobe PDF | View/Open |
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