Luminescence, Raman and synchrotron XPS study of amorphous Ge2S3 based films

Abstract

Ge2S3-based films have been investigated using Raman, photoluminescence and photoemission spectroscopy. For the sake of comparison some of the photoluminescent properties of bulk glasses have been used. The synchrotron photoelectron spectroscopy (SRPES) and XPS spectra of a-Ge2S3 films have been measured after the illumination and annealing. The changes in the parameters of the film’s core levels induced by near or above band gap light and thermal treatment are discussed in the paper. We consider the possibility that the PL radiation in Ge2S3-based films is a surface contaminant effect from native oxidized layer, which might have formed in the air.