Please use this identifier to cite or link to this item: https://dspace.uzhnu.edu.ua/jspui/handle/lib/49119
Title: Effect of X-ray and β-irradiation on the refractive index of complex chalcogenides glasses
Authors: Zhikharev, V. N.
Kozak, M. I.
Shiposh, Yu.І.
Keywords: refractive index, ellipsometric method
Issue Date: Oct-2019
Publisher: Ужгород УжНУ
Citation: V.N.Zhikharev, M.I.Kozak, Yu.I.Shiposh. Effect of X-ray and β-irradiation on the refractive index of complex chalcogenides glasses // VIII International seminar "Properties of ferroelectric and superionic systems" Ukraine, Uzhhorod, 29-30 October, 2019, р.102-104.
Abstract: The effect of irradiation dose on the refractive index and thickness of the surface film (n1, k1, d) and sample volume (n2, k2) were investigated. The refractive index n and extinction k were determined using an LEF-3M ellipsometer with a Ne-Ne laser (λ = 632.8 nm).
Description: We investigated samples of glass Sb24Se60Ge16 and Sb20Se60Ge20, before and after X-ray irradiation, and samples (As2S3)1-X(AsI3)X (X = 0.04; 0.05; 0.07; 0.08; 0.1; 0.2; 0.3) before and after β-irradiation with eight doses.
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Publication type: Стаття
URI: https://dspace.uzhnu.edu.ua/jspui/handle/lib/49119
Appears in Collections:Наукові публікації кафедри фізики напівпровідників

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