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Title: | Microhardness of single-crystal samples of Ag7+x(P1–xGex)S6 solid solutions. |
Authors: | Shender, I.O. Pogodin, A. I. Filep, M. J. Malakhovska, T. O. Kokhan, O. P. Bilanych, V. S. Babuka, T. Ya. Izai, V. Yu |
Keywords: | Microhardness, microhardness; single crystal |
Issue Date: | 2024 |
Publisher: | Semiconductor Physics, Quantum Electronics and Optoelectronics |
Citation: | 2. Shender I. O., Pogodin A. I., Filep M. J., Malakhovska T. O., Kokhan O. P., Bilanych V. S., Babuka T. Ya., Izai V. Yu. Microhardness of single-crystal samples of Ag7+x(P1–xGex)S6 solid solutions. Semiconductor Physics, Quantum Electronics and Optoelectronics. 2024. Vol. 27, Issue 2. P. 169–175 |
Abstract: | This work presents the results of microhardness investigations of single-crystal samples of Ag7+x(P1–xGex)S6 (x = 0, 0.1, 0.25, 0.33, 0.5, 0.75, 1) solid solutions. The dependences of microhardness H on load P and sample composition were investigated. The microhardness was found to decrease with applied load, which indicates presence of “normal” indentation size effect in Ag7+x(P1–xGex)S6 solid solutions. The obtained results were approximated in the framework of the geometrically necessary dislocations (Nix– Gao) model, and the model parameters were found. The effect of heterovalent Р5+ → Ge4+ substitution on the mechanical properties of Ag7+x(P1–xGex)S6 crystals was determined. |
Type: | Text |
Publication type: | Стаття |
URI: | https://dspace.uzhnu.edu.ua/jspui/handle/lib/69513 |
Appears in Collections: | Наукові публікації кафедри прикладної фізики і квантової електроніки |
Files in This Item:
File | Description | Size | Format | |
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2024 Microhardness of single-crystal samples.pdf.crdownload | 1.08 MB | Unknown | View/Open |
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