Please use this identifier to cite or link to this item: https://dspace.uzhnu.edu.ua/jspui/handle/lib/69513
Title: Microhardness of single-crystal samples of Ag7+x(P1–xGex)S6 solid solutions.
Authors: Shender, I.O.
Pogodin, A. I.
Filep, M. J.
Malakhovska, T. O.
Kokhan, O. P.
Bilanych, V. S.
Babuka, T. Ya.
Izai, V. Yu
Keywords: Microhardness, microhardness; single crystal
Issue Date: 2024
Publisher: Semiconductor Physics, Quantum Electronics and Optoelectronics
Citation: 2. Shender I. O., Pogodin A. I., Filep M. J., Malakhovska T. O., Kokhan O. P., Bilanych V. S., Babuka T. Ya., Izai V. Yu. Microhardness of single-crystal samples of Ag7+x(P1–xGex)S6 solid solutions. Semiconductor Physics, Quantum Electronics and Optoelectronics. 2024. Vol. 27, Issue 2. P. 169–175
Abstract: This work presents the results of microhardness investigations of single-crystal samples of Ag7+x(P1–xGex)S6 (x = 0, 0.1, 0.25, 0.33, 0.5, 0.75, 1) solid solutions. The dependences of microhardness H on load P and sample composition were investigated. The microhardness was found to decrease with applied load, which indicates presence of “normal” indentation size effect in Ag7+x(P1–xGex)S6 solid solutions. The obtained results were approximated in the framework of the geometrically necessary dislocations (Nix– Gao) model, and the model parameters were found. The effect of heterovalent Р5+ → Ge4+ substitution on the mechanical properties of Ag7+x(P1–xGex)S6 crystals was determined.
Type: Text
Publication type: Стаття
URI: https://dspace.uzhnu.edu.ua/jspui/handle/lib/69513
Appears in Collections:Наукові публікації кафедри прикладної фізики і квантової електроніки

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