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https://dspace.uzhnu.edu.ua/jspui/handle/lib/4045| Title: | OPTICAL COATINGS BASED ON NON-CRYSTALLINE FILMS WITH TRANSITION SUBSTRATE-FILM LAYERS: SIMS AND AUGER PROFILES |
| Authors: | Міца, Олександр Володимирович Фекешгазі, Іштван Вінсеєвич Угрін, Олександр Михайлович |
| Keywords: | SIMS profile, Chalcogenide films, Inhomogeneous film |
| Issue Date: | Aug-2005 |
| Abstract: | The results of studies by the SIMS and Auger spectroscopy methods of element distribution in a-As2S3 and a-GeS2 films prepared by vacuum evaporation on Si substrates are presented. In a-GeS2 films the extended transition region with dimensions of ~ 30 nm has been observed. The intensity of interference maximum of such slightly inhomogeneous thin films on glassy substrate is higher than the maximum of transmission level of the free glassy substrate. |
| Type: | Text |
| Publication type: | Стаття |
| URI: | https://dspace.uzhnu.edu.ua/jspui/handle/lib/4045 |
| Appears in Collections: | Наукові публікації кафедри інформаційних управляючих систем та технологій |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Mitsa2.pdf | 509.26 kB | Adobe PDF | View/Open |
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