Please use this identifier to cite or link to this item:
https://dspace.uzhnu.edu.ua/jspui/handle/lib/13| Title: | Comparison of sensitivity of Ge(9)As(9)Se(82) and Ge(16)As(24)Se(60) thin films to irradiation with electron beam |
| Authors: | Shylenko, O. Bilanych, V. Feher, A. Rizak, V. Komanicky, V. |
| Issue Date: | 2017 |
| Citation: | Shylenko O., Bilanych V., Feher A., Rizak V., Komanicky V. Comparison of sensitivity of Ge9As9Se82 and Ge16As24Se60 thin films to irradiation with electron beam //8th International Conference on Amorphous and Nanostructured Chalcogenides. Abstract Book/ Sinaia, Romania, July 2-5, 2017, p.37-38. |
| Series/Report no.: | 8th International Conference on Amorphous and Nanostructured Chalcogenides. Abstract Book; |
| Type: | Text |
| Publication type: | Тези до статті |
| URI: | https://dspace.uzhnu.edu.ua/jspui/handle/lib/13 |
| Appears in Collections: | Наукові публікації кафедри прикладної фізики |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 2017_Romania_Sinaia_Abstract_Book_P_37-38.pdf | 2.37 MB | Adobe PDF | View/Open |
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